| Measurement Modes | % Rfl & %Trn |
| Measurement Principle | Dual Beam |
| Sphere Dimension | 152 mm Diameter |
| Light Source | Pulsed Xenon |
| Wavelength Range | 360 nm To 700 nm |
| Wavelength Interval | 10 nm |
| Photometric Range | 0% To 200% |
| Optical Configuration | D/8 Or D/0 Viewing Geometry |
| Wavelength Accuracy | 0.1 nm (avg.) |
| Repeatability | Less Than 0.1 De Cielab (White Tile) |
| Inter Instrument | |
| Agreement (LAV) | 0.15 De (max.) |
| Measurement Time | 2 sec. |
| Large Area View (LAV) | 25.4 mm Diameter |
| Medium Area View (MAV) | 5.0 mm X 10.0 mm |
| *Small Area View (SAV) | 12.0 mm Diameter |
| *Very Small Area View (VSAV) | 3 mm Diameter |
| Uv Filter | In / Out |
| *Visible Cut-Off Filter | 420 nm / 465 nm / 560 nm |
| Specular Component | Included / Excluded |
| Operating Temperature | 15°C To 32°C |
| Relative Humidity | < 90% Non-Condensing |
| Electrical Requirements | 110-120 VAC / 50-60 Hz Or 230-240 VAC / 50-60 Hz |
| Weight | 21 kg. approx. |
| Size | 61 cm X 29.5 cm X 33 cm |
Products & Services
Color Inspection & Measurement Instruments
SS 5100H Spectrophotometer
SS 5100H is a State-of-the-Art dual beam spectrophotometer for color measurement. It is extremely rugged in construction and very accurate in performance.
SS 5100H is the result of our own in-depth study and sophisticated design after being in the field for long time, we have incorporated best features which can be seen on international class of spectros. SS 5100H has an advanced Aberration Corrected Concave holographic grating for dispersion reflected light coupled with highly accurate discrete sensing photodiode array detector.
The integrating sphere conforms to CIE / ASTM specifications for size, which is 152 mm diameter. The source is a very stable long-life Xenon flash lamp which is carefully filtered to D65.